By Eiji Takeda,Cary Y. Yang,Akemi Miura-Hamada
ISBN-10: 0123958040
ISBN-13: 9780123958044
ISBN-10: 0126822409
ISBN-13: 9780126822403
The exploding variety of makes use of for ultrafast, ultrasmall built-in circuits has elevated the significance of hot-carrier results in production in addition to for different technological purposes. they're swiftly movingout of the examine lab and into the genuine world.
This e-book is derived from Dr. Takedas ebook in eastern, Hot-Carrier Effects, (published in 1987 through Nikkei enterprise Publishers). even though, the recent booklet is far greater than a translation. Takedas unique paintings was once a place to begin for constructing this even more entire and primary textual content in this more and more vital subject. the recent paintings encompasses not just all of the most modern learn and discoveries made within the fast moving region of scorching vendors, but in addition contains the fundamentals of MOS units, and the sensible concerns relating to sizzling carriers.
- Chapter one itself is a accomplished evaluate of MOS gadget physics which permits a reader with little historical past in MOS units to choose up a enough quantity of knowledge for you to persist with the remainder of the book
- The e-book is written to permit the reader to profit approximately MOS machine Reliability in a comparatively brief period of time, making the texts precise remedy of hot-carrier results in particular necessary and instructive to either researchers and others with varyingamounts of expertise within the field
- The logical association of the booklet starts off via discussing identified rules, then progresses to empirical details and, eventually, to sensible solutions
- Provides the main entire evaluation of equipment degradation mechanisms in addition to drain engineering methods
- Contains the main large reference record at the subject
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Hot-Carrier Effects in MOS Devices by Eiji Takeda,Cary Y. Yang,Akemi Miura-Hamada
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